SHINTANI, Michihiro: search on Z-Library

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1

[IEEE 2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Fayetteville, AR, USA (2016.11.7-2016.11.9)] 2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Analysis of transient behavior of SiC power MOSFETs based on surface potential model and its application to boost converter

Okuda, Takafumi, Nakamura, Yohei, Hikihara, Takashi, Shintani, Michihiro, Sato, Takashi

Year:

2016

Language:

english

File:

PDF, 916 KB

english, 2016

2

[IEEE 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC) - Jeju, Korea (South) (2018.1.22-2018.1.25)] 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC) - Efficient worst-case timing analysis of critical-path delay under workload-dependent aging degradation

Morita, Shumpei, Bian, Song, Shintani, Michihiro, Hiromoto, Masayuki, Sato, Takashi

Year:

2018

Language:

english

File:

PDF, 372 KB

english, 2018

3

Surface-Potential-Based Silicon Carbide Power MOSFET Model for Circuit Simulation

Shintani, Michihiro, Nakamura, Yohei, Oishi, Kazuki, Hiromoto, Masayuki, Hikihara, Takashi, Sato, Takashi

Journal:

IEEE Transactions on Power Electronics

Year:

2018

Language:

english

File:

PDF, 3.91 MB

english, 2018

4

[IEEE 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) - Kita-Kyushu City, Fukuoka, Japan (2019.3.18-2019.3.21)] 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) - A study on statistical parameter modeling of power MOSFET model by principal component analysis

Tsukamoto, Hiroki, Shintani, Michihiro, Sato, Takashi

Year:

2019

Language:

english

File:

PDF, 21.64 MB

english, 2019

5

[IEEE 2010 IEEE International Symposium on Circuits and Systems - ISCAS 2010 - Paris, France (2010.05.30-2010.06.2)] Proceedings of 2010 IEEE International Symposium on Circuits and Systems - Scan based process parameter estimation through path-delay inequalities

Uezono, Takumi, Takahashi, Tomoyuki, Shintani, Michihiro, Hatayama, Kazumi, Masu, Kazuya, Ochi, Hiroyuki, Sato, Takashi

Year:

2010

Language:

english

File:

PDF, 191 KB

english, 2010

6

Mechanically and electrically robust metal-mask design for organic CMOS circuits

Shintani, Michihiro, Qin, Zhaoxing, Kuribara, Kazunori, Ogasahara, Yasuhiro, Hiromoto, Masayuki, Sato, Takashi

Journal:

Japanese Journal of Applied Physics

Year:

2018

Language:

english

File:

PDF, 1.73 MB

english, 2018

7

[IEEE 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Austin, TX (2018.3.19-2018.3.22)] 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Efficient parameter-extraction of SPICE compact model through automatic differentiation

Shintani, Michihiro, Hiromoto, Masayuki, Sato, Takashi

Year:

2018

Language:

english

File:

PDF, 380 KB

english, 2018

8

Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing

Shintani, Michihiro, Uezono, Takumi, Hatayama, Kazumi, Masu, Kazuya, Sato, Takashi

Journal:

Journal of Electronic Testing

Year:

2016

Language:

english

File:

PDF, 1.13 MB

english, 2016

9

[IEEE 2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Raleigh, NC, USA (2019.10.29-2019.10.31)] 2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Parameter Extraction Procedure for Surface-Potential-Based SiC MOSFET Model

Shintani, Michihiro, Tsukamoto, Hiroki, Sato, Takashi

Year:

2019

File:

PDF, 4.47 MB

2019

10

Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs

Tsukamoto, Hiroki, Shintani, Michihiro, Sato, Takashi

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2020

File:

PDF, 1.66 MB

2020

11

[IEEE 2019 32nd IEEE International System-on-Chip Conference (SOCC) - Singapore (2019.9.3-2019.9.6)] 2019 32nd IEEE International System-on-Chip Conference (SOCC) - Cycle-Accurate Evaluation of Software-Hardware Co-Design of Decimal Computation in RISC-V Ecosystem

Mian, Riaz-ul-haque, Shintani, Michihiro, Inoue, Michiko

Year:

2019

File:

PDF, 134 KB

2019

12

Measurement and Modeling of Ambient-Air-Induced Degradation in Organic Thin-Film Transistor

Shintani, Michihiro, Saito, Michiaki, Kuribara, Kazunori, Ogasahara, Yasuhiro, Sato, Takashi

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2020

File:

PDF, 1.89 MB

2020

13

[IEEE 2009 IEEE Asian Solid-State Circuits Conference (A-SSCC) - Taipei, Taiwan (2009.11.16-2009.11.18)] 2009 IEEE Asian Solid-State Circuits Conference - On-die parameter extraction from path-delay measurements

Takahashi, Tomoyuki, Uezono, Takumi, Shintani, Michihiro, Masu, Kazuya, Sato, Takashi

Year:

2009

Language:

english

File:

PDF, 571 KB

english, 2009

14

[IEEE 2017 IEEE 26th Asian Test Symposium (ATS) - Taipei City, Taiwan (2017.11.27-2017.11.30)] 2017 IEEE 26th Asian Test Symposium (ATS) - Intra-Die-Variation-Aware Side Channel Analysis for Hardware Trojan Detection

Hossain, Fakir Sharif, Yoneda, Tomokazu, Shintani, Michihiro, Inoue, Michiko, Orailoglo, Alex

Year:

2017

Language:

english

File:

PDF, 473 KB

english, 2017

15

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Small Delay Fault Model for Intra-Gate Resistive Open Defects

Arai, Masayuki, Suto, Akifumi, Iwasaki, Kazuhiko, Nakano, Katsuyuki, Shintani, Michihiro, Hatayama, Kazumi, Aikyo, Takashi

Year:

2009

Language:

english

File:

PDF, 829 KB

english, 2009

16

[IEEE 2019 IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS) - Glasgow, United Kingdom (2019.7.8-2019.7.10)] 2019 IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS) - OCM-PUF: organic current mirror PUF with enhanced resilience to device degradation

Qin, Zhaoxing, Shintani, Michihiro, Kuribara, Kazunori, Ogasahara, Yasuhiro, Sato, Takashi

Year:

2019

Language:

english

File:

PDF, 3.95 MB

english, 2019

17

[IEEE 2018 IEEE International Test Conference (ITC) - Phoenix, AZ, USA (2018.10.29-2018.11.1)] 2018 IEEE International Test Conference (ITC) - Variation-Aware Hardware Trojan Detection through Power Side-channel

Hossain, Fakir Sharif, Shintani, Michihiro, Inoue, Michiko, Orailoglu, Alex

Year:

2018

File:

PDF, 9 KB

2018

18

Psychophysical evaluation of calibration curve for diagnostic LCD monitor

Masanobu Uemura, Yoshiyuki Asai, Michihiro Yamaguchi, Hideki Fujita, Yuuko Shintani, Shigeru Sanada

Journal:

Japanese Journal of Radiology

Year:

2006

Language:

english

File:

PDF, 258 KB

english, 2006

19

Identification and Application of Invariant Critical Paths under NBTI Degradation

BIAN, Song, MORITA, Shumpei, SHINTANI, Michihiro, AWANO, Hiromitsu, HIROMOTO, Masayuki, SATO, Takashi

Journal:

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences

Year:

2017

Language:

english

File:

PDF, 1.28 MB

english, 2017

20

Recovery-aware bias-stress degradation model for organic thin-film transistors considering drain and gate bias voltages

Oshima, Kunihiro, Shintani, Michihiro, Kuribara, Kazunori, Ogasahara, Yasuhiro, Sato, Takashi

Journal:

Japanese Journal of Applied Physics

Year:

2019

File:

PDF, 945 KB

2019

21

[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - A Bayesian-based process parameter estimation using IDDQ current signature

Shintani, Michihiro, Sato, Takashi

Year:

2012

Language:

english

File:

PDF, 845 KB

english, 2012

22

[IEEE 2018 IEEE International Test Conference (ITC) - Phoenix, AZ, USA (2018.10.29-2018.11.1)] 2018 IEEE International Test Conference (ITC) - Artificial Neural Network Based Test Escape Screening Using Generative Model

Shintani, Michihiro, Inoue, Michiko, Nakamura, Yoshiyuki

Year:

2018

Language:

english

File:

PDF, 33 KB

english, 2018

23

Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling

Ahmed, Foisal, Shintani, Michihiro, Inoue, Michiko

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2020

File:

PDF, 6.82 MB

2020

24

[IEEE 2016 17th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2016.3.15-2016.3.16)] 2016 17th International Symposium on Quality Electronic Design (ISQED) - Nonlinear delay-table approach for full-chip NBTI degradation prediction

Song Bian,, Shintani, Michihiro, Morita, Shumpei, Hiromoto, Masayuki, Sato, Takashi

Year:

2016

Language:

english

File:

PDF, 1013 KB

english, 2016

25

Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor Circuit

Ishizaka, Mamoru, Shintani, Michihiro, Inoue, Michiko

Journal:

Journal of Electronic Testing

Year:

2020

File:

PDF, 1.43 MB

2020

26

[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - An Adaptive Test for Parametric Faults Based on Statistical Timing Information

Shintani, Michihiro, Uezono, Takumi, Takahashi, Tomoyuki, Ueyama, Hiroyuki, Sato, Takashi, Hatayama, Kazumi, Aikyo, Takashi, Masu, Kazuya

Year:

2009

Language:

english

File:

PDF, 464 KB

english, 2009

27

[IEEE 2019 IEEE European Test Symposium (ETS) - Baden-Baden, Germany (2019.5.27-2019.5.31)] 2019 IEEE European Test Symposium (ETS) - Feature Engineering for Recycled FPGA Detection Based on WID Variation Modeling

Ahmed, Foisal, Shintani, Michihiro, Inoue, Michiko

Year:

2019

Language:

english

File:

PDF, 573 KB

english, 2019

28

[IEEE 2018 IEEE 27th Asian Test Symposium (ATS) - Hefei, China (2018.10.15-2018.10.18)] 2018 IEEE 27th Asian Test Symposium (ATS) - Area-Efficient and Reliable Hybrid CMOS/Memristor ECC Circuit for ReRAM Storage

Ishizaka, Mamoru, Shintani, Michihiro, Inoue, Michiko

Year:

2018

File:

PDF, 577 KB

2018

29

[IEEE 2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Fayetteville, AR, USA (2016.11.7-2016.11.9)] 2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - A circuit simulation model for V-groove SiC power MOSFET

Shintani, Michihiro, Oishi, Kazuki, Zhou, Rui, Hiromoto, Masayuki, Sato, Takashi

Year:

2016

Language:

english

File:

PDF, 951 KB

english, 2016

30

[IEEE 2018 China Semiconductor Technology International Conference (CSTIC) - Shanghai (2018.3.11-2018.3.12)] 2018 China Semiconductor Technology International Conference (CSTIC) - Electrical and thermal characterization of SiC power MOSFET

Sato, Takashi, Oishi, Kazuki, Hiromoto, Masayuki, Shintani, Michihiro

Year:

2018

Language:

english

File:

PDF, 854 KB

english, 2018

31

Device-Parameter Estimation through IDDQ Signatures

SHINTANI, Michihiro, SATO, Takashi

Journal:

IEICE Transactions on Information and Systems

Year:

2013

Language:

english

File:

PDF, 1.29 MB

english, 2013

32

[IEEE 2018 International Power Electronics Conference (IPEC-Niigata 2018-ECCE Asia) - Niigata (2018.5.20-2018.5.24)] 2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia) - A Plotter-Based Automatic Measurement and Statistical Characterization of Multiple Discrete Power Devices

Shintani, Michihiro, Dauphin, Benjamin, Oishi, Kazuki, Hiromoto, Masayuki, Sato, Takashi

Year:

2018

Language:

english

File:

PDF, 1.35 MB

english, 2018

33

An Adaptive Decompressor for Test Application with Variable-Length Coding

Ichihara, Hideyuki, Ochi, Masakuni, Shintani, Michihiro, Inoue, Tomoo

Journal:

IPSJ Digital Courier

Year:

2006

Language:

english

File:

PDF, 364 KB

english, 2006

34

[IEEE 2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Fayetteville, AR, USA (2016.11.7-2016.11.9)] 2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Identifications of thermal equivalent circuit for power MOSFETs through in-situ channel temperature estimation

Oishi, Kazuki, Shintani, Michihiro, Hiromoto, Masayuki, Sato, Takashi

Year:

2016

Language:

english

File:

PDF, 265 KB

english, 2016

35

[IEEE 2016 International Conference on Microelectronic Test Structures (ICMTS) - Yokohama, Japan (2016.3.28-2016.3.31)] 2016 International Conference on Microelectronic Test Structures (ICMTS) - A high power curve tracer for characterizing full operational range of SiC power transistors

Nakamura, Yohei, Shintani, Michihiro, Sato, Takashi, Hikihara, Takashi

Year:

2016

Language:

english

File:

PDF, 5.86 MB

english, 2016

36

[ACM Press the 26th edition - Boston, Massachusetts, USA (2016.05.18-2016.05.20)] Proceedings of the 26th edition on Great Lakes Symposium on VLSI - GLSVLSI '16 - Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation

Bian, Song, Shintani, Michihiro, Morita, Shumpei, Awano, Hiromitsu, Hiromoto, Masayuki, Sato, Takashi

Year:

2016

Language:

english

File:

PDF, 955 KB

english, 2016

37

[IEEE 2017 18th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2017.3.14-2017.3.15)] 2017 18th International Symposium on Quality Electronic Design (ISQED) - Comparative study of path selection and objective function in replacing NBTI mitigation logic

Morita, Shumpei, Bian, Song, Shintani, Michihiro, Hiromoto, Masayuki, Sato, Takashi

Year:

2017

Language:

english

File:

PDF, 231 KB

english, 2017

38

[ACM Press the 54th Annual Design Automation Conference 2017 - Austin, TX, USA (2017.06.18-2017.06.22)] Proceedings of the 54th Annual Design Automation Conference 2017 on - DAC '17 - LSTA

Bian, Song, Shintani, Michihiro, Hiromoto, Masayuki, Sato, Takashi

Year:

2017

Language:

english

File:

PDF, 691 KB

english, 2017

39

Modeling of interelectrode parasitic elements of V-groove SiC MOSFET

Zhou, Rui, Shintani, Michihiro, Hiromoto, Masayuki, Sato, Takashi

Journal:

Nonlinear Theory and Its Applications IEICE

Year:

2018

Language:

english

File:

PDF, 3.03 MB

english, 2018

40

Amino acid substitutions in the S region of hepatitis B virus in sera from patients with acute hepatitis

Junko Aono, Hiroshi Yotsuyanagi, Hideyuki Miyoshi, Takeya Tsutsumi, Hajime Fujie, Yoshizumi Shintani, Kyoji Moriya, Chiaki Okuse, Michihiro Suzuki, Kiyomi Yasuda, Shiro Iino, Kazuhiko Koike

Journal:

Hepatology Research

Year:

2007

Language:

english

File:

PDF, 393 KB

english, 2007

41

[ACM Press the 2005 conference - Shanghai, China (2005.01.18-2005.01.21)] Proceedings of the 2005 conference on Asia South Pacific design automation - ASP-DAC '05 - A Huffman-based coding with efficient test application

Shintani, Michihiro, Ohara, Toshihiro, Ichihara, Hideyuki, Inoue, Tomoo

Year:

2005

Language:

english

File:

PDF, 73 KB

english, 2005

42

Measurement and modeling of gate–drain capacitance of silicon carbide vertical double-diffused MOSFET

Shintani, Michihiro, Nakamura, Yohei, Hiromoto, Masayuki, Hikihara, Takashi, Sato, Takashi

Journal:

Japanese Journal of Applied Physics

Year:

2017

Language:

english

File:

PDF, 1.25 MB

english, 2017

43

Identification and Application of Invariant Critical Paths under NBTI Degradation

BIAN, Song, MORITA, Shumpei, SHINTANI, Michihiro, AWANO, Hiromitsu, HIROMOTO, Masayuki, SATO, Takashi

Journal:

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences

Year:

2017

File:

PDF, 1.28 MB

2017

44

Organic Current Mirror PUF for Improved Stability against Device Aging

Qin, Zhaoxing, Shintani, Michihiro, Kuribara, Kazunori, Ogasahara, Yasuhiro, Sato, Takashi

Journal:

IEEE Sensors Journal

Year:

2020

File:

PDF, 1.63 MB

2020

45

[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - Path clustering for adaptive test

Uezono, Takumi, Takahashi, Tomoyuki, Shintani, Michihiro, Hatayama, Kazumi, Masu, Kazuya, Ochi, Hiroyuki, Sato, Takashi

Year:

2010

Language:

english

File:

PDF, 595 KB

english, 2010

46

[IEEE 2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2014.11.2-2014.11.6)] 2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Sensorless estimation of global device-parameters based on Fmax testing

Shintani, Michihiro, Sato, Takashi

Year:

2014

Language:

english

File:

PDF, 1.23 MB

english, 2014

47

[IEEE 2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC) - Chiba, Japan (2017.1.16-2017.1.19)] 2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC) - Pattern based runtime voltage emergency prediction: An instruction-aware block sparse compressed sensing approach

Chen, Yu-Guang, Shintani, Michihiro, Sato, Takashi, Shi, Yiyu, Chang, Shih-Chieh

Year:

2017

Language:

english

File:

PDF, 271 KB

english, 2017

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